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Semiconductor Material and Device Characterization, 3rd Edition

Dieter K. Schroder
ISBN: 978-0-471-73906-7
Hardcover
800 pages
June 2015, Wiley-IEEE Press
List Price: US $212.95
Government Price: US $143.32
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Semiconductor Material and Device Characterization, 3rd Edition (0471739065) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.

“The book is well-illustrated and provides an ample bibliography.”  (Optics & Photonics News, 4 November 2015)

"I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)

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