Semiconductor Material and Device Characterization, 3rd EditionISBN: 978-0-471-73906-7
Hardcover
800 pages
June 2015, Wiley-IEEE Press
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
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Written by the main authority in the field of semiconductor characterization
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New end-of-chapter problems
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Out of date figures have been replaced
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Extensive, up-to-date references
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Revised material throughout, as well as two fully new chapters
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An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.