Semiconductor Memories: Technology, Testing, and ReliabilityISBN: 978-0-7803-1000-1
Hardcover
480 pages
September 2002, Wiley-IEEE Press
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
|
||||||
Semiconductor Memories provides in-depth coverage in the areas of
design for testing, fault tolerance, failure modes and mechanisms,
and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
This Title is Part of the Following Set
Related Titles
More By This Author
General Electronic Materials
Read an Excerpt
.png){kind=small}
Join An E-mail ListLearn about the latest products, events, offers and content. |
