Use the controls in the window below to browse, scroll, or search inside this book.
Semiconductor Material and Device Characterization, 3rd Edition
ISBN: 978-0-471-73906-7
Hardcover
800 pages
June 2015, Wiley-IEEE Press
List Price: | US $212.95 |
Government Price: | US $143.32 |
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.