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Semiconductor Material and Device Characterization, 3rd Edition

Dieter K. Schroder
ISBN: 978-0-471-73906-7
Hardcover
800 pages
June 2015, Wiley-IEEE Press
List Price: US $212.95
Government Price: US $143.32
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Semiconductor Material and Device Characterization, 3rd Edition (0471739065) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.

  • Updated and revised figures and examples reflecting the most current data and information
  • 260 new references offering access to the latest research and discussions in specialized topics
  • Revisions and updated sections in each chapter
  • Two new chapters: Charge-Based and Probe Characterization and Reliability and Failure Analysis
  • New problems and review questions at the end of each chapter to test students understanding

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