Semiconductor Material and Device Characterization, 3rd Edition

ISBN: 978-0-471-73906-7

Hardcover

800 pages

June 2015, Wiley-IEEE Press

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“The book is well-illustrated and provides an ample bibliography.” (Optics & Photonics News, 4 November 2015)

"I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)

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