Semiconductor Material and Device Characterization, 3rd Edition

ISBN: 978-0-471-73906-7

Hardcover

800 pages

June 2015, Wiley-IEEE Press

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Semiconductor Material and Device Characterization, 3rd Edition (0471739065) cover image

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Updated and revised figures and examples reflecting the most current data and information
260 new references offering access to the latest research and discussions in specialized topics
Revisions and updated sections in each chapter
Two new chapters: Charge-Based and Probe Characterization and Reliability and Failure Analysis
New problems and review questions at the end of each chapter to test students understanding

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