Semiconductor Material and Device Characterization, 3rd Edition

ISBN: 978-0-471-73906-7

Hardcover

800 pages

June 2015, Wiley-IEEE Press

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Semiconductor Material and Device Characterization, 3rd Edition (0471739065) cover image

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Written by the main authority in the field of semiconductor characterization
New end-of-chapter problems
Out of date figures have been replaced
Extensive, up-to-date references
Revised material throughout, as well as two fully new chapters
An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

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