Thin Film Analysis by X-Ray ScatteringISBN: 978-3-527-31052-4
Hardcover
378 pages
December 2005
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 15-20 days delivery time. The book is not returnable.
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Principles of X-Ray Diffraction
Identification of Chemical Phases
Line Profile Analysis
Grazing Incidence Configurations
Texture and Preferred Orientation
Residual Stress Analysis
High Resolution X-ray Diffraction
Identification of Chemical Phases
Line Profile Analysis
Grazing Incidence Configurations
Texture and Preferred Orientation
Residual Stress Analysis
High Resolution X-ray Diffraction
Related Titles
Materials Characterization
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