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Thin Film Analysis by X-Ray Scattering

Mario Birkholz
ISBN: 978-3-527-31052-4
Hardcover
378 pages
December 2005
List Price: US $195.00
Government Price: US $135.00
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Thin Film Analysis by X-Ray Scattering (3527310525) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 15-20 days delivery time. The book is not returnable.

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