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Characterization and Control of Interfaces for High Quality Advanced Materials

Kevin Ewsuk (Editor), Kiyoshi Nogi (Editor), Markus Reiterer (Editor), Antoni Tomsia (Editor), S. Jill Glass (Editor), Rolf Waesche (Editor), Keizo Uematsu (Editor), Makio Naito (Editor)
ISBN: 978-1-57498-170-4
Paperback
504 pages
April 2003
List Price: US $133.00
Government Price: US $92.12
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Kevin Ewsuk is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Kiyoshi Nogi is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Markus Reiterer is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Antoni Tomsia is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

S. Jill Glass is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Rolf Waesche is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Keizo Uematsu is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

Makio Naito is the editor of Characterization and Control of Interfaces for High Quality Advanced Materials, published by Wiley.

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