Digital Systems Testing and Testable DesignISBN: 978-0-7803-1062-9
Hardcover
672 pages
September 1994, Wiley-IEEE Press
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
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Preface.
How This Book Was Written.
Introduction.
Modeling.
Logic Simulation.
Fault Modeling.
Fault Simulation.
Testing For Single Stuck Faults.
Testing For Bridging Faults.
Functional Testing.
Design For Testability.
Compression Techniques.
Built-In Self-Test.
Logic-Level Diagnosis.
Self-Checking Design.
PLA Testing.
System-Level Diagnosis.
Index.
How This Book Was Written.
Introduction.
Modeling.
Logic Simulation.
Fault Modeling.
Fault Simulation.
Testing For Single Stuck Faults.
Testing For Bridging Faults.
Functional Testing.
Design For Testability.
Compression Techniques.
Built-In Self-Test.
Logic-Level Diagnosis.
Self-Checking Design.
PLA Testing.
System-Level Diagnosis.
Index.
Related Titles
General Circuit Theory & Design
Read an Excerpt
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