Digital Systems Testing and Testable DesignISBN: 978-0-7803-1062-9
Hardcover
672 pages
September 1994, Wiley-IEEE Press
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
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Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
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