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Ionizing Radiation Effects in MOS Devices and Circuits

T. P. Ma (Editor), Paul V. Dressendorfer (Editor)
ISBN: 978-0-471-84893-6
Hardcover
608 pages
April 1989
List Price: US $345.25
Government Price: US $238.68
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Ionizing Radiation Effects in MOS Devices and Circuits (047184893X) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.

The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.

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