Reliability Wearout Mechanisms in Advanced CMOS Technologies

Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch, III

ISBN: 978-0-471-73172-6

Hardcover

624 pages

August 2009, Wiley-IEEE Press

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Government Price:	US $135.63
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It is the only comprehensive and current book that addresses all of the significant technology of reliability wearout mechanisms.
It is unique in providing the fundamental reliability physics and step-by-step procedures to move readers from a theoretical understanding to practical applications.
Practical appendices at the end of each part provide very basic experimental procedures for engineers who are conducting reliability experiments for the first time. This "cookbook" approach includes experiment design, performing the stressing in the laboratory, data analysis, reliability projections, and interpreting the meaning of the projections.
A separate question and answer manual accompanies the book.