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Reliability Wearout Mechanisms in Advanced CMOS Technologies

Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch, III
ISBN: 978-0-471-73172-6
Hardcover
624 pages
August 2009, Wiley-IEEE Press
List Price: US $196.50
Government Price: US $135.63
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