Built In Test for VLSI: Pseudorandom TechniquesISBN: 978-0-471-62463-9
Hardcover
368 pages
October 1987
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
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Paul H. Bardell and W. H. McAnney are the authors of Built In Test for VLSI: Pseudorandom Techniques, published by Wiley.
Related Titles
Circuit Theory & Design / VLSI / ULSI
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