Electromigration and Electronic Device DegradationISBN: 978-0-471-58489-6
Hardcover
343 pages
January 1994
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
|
||||||
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
Related Titles
General Components & Devices
.png){kind=small}
Join An E-mail ListLearn about the latest products, events, offers and content. |
