Electromigration and Electronic Device DegradationISBN: 978-0-471-58489-6
Hardcover
343 pages
January 1994
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
|
||||||
Reliability and Electromigration Degradation of GaAs MicrowaveMonolithic Integrated Circuits (A. Christou).
Simulation and Computer Models for Electromigration (P.Tang).
Temperature Dependencies on Electromigration (M. Pecht & P.Lall).
Electromigration and Related Failure Mechanisms in VLSIMetallizations (A. Christou & M. Peckerar).
Metallic Electromigration Phenomena (S. Krumbein).
Theoretical and Experimental Study of Electromigration (J.Zhao).
GaAs on Silicon Performance and Reliability (P. Panayotatos, etal.).
Electromigration and Stability of Multilayer Metal-SemiconductorSystems on GaAs (A. Christou).
Electrothermomigration Theory and Experiments in Aluminum Thin FilmMetallizations (A. Christou).
Reliable Metallization for VLSI (M. Peckerar).
Index.
Simulation and Computer Models for Electromigration (P.Tang).
Temperature Dependencies on Electromigration (M. Pecht & P.Lall).
Electromigration and Related Failure Mechanisms in VLSIMetallizations (A. Christou & M. Peckerar).
Metallic Electromigration Phenomena (S. Krumbein).
Theoretical and Experimental Study of Electromigration (J.Zhao).
GaAs on Silicon Performance and Reliability (P. Panayotatos, etal.).
Electromigration and Stability of Multilayer Metal-SemiconductorSystems on GaAs (A. Christou).
Electrothermomigration Theory and Experiments in Aluminum Thin FilmMetallizations (A. Christou).
Reliable Metallization for VLSI (M. Peckerar).
Index.
Related Titles
General Components & Devices
.png){kind=small}
Join An E-mail ListLearn about the latest products, events, offers and content. |
