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Digital Systems Testing and Testable Design

ISBN: 978-0-7803-1062-9
Hardcover
672 pages
September 1994, Wiley-IEEE Press
List Price: US $201.75
Government Price: US $139.47
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Digital Systems Testing and Testable Design (0780310624) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.

This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

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