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Semiconductor Material and Device Characterization, 3rd Edition

Dieter K. Schroder
ISBN: 978-0-471-73906-7
Hardcover
800 pages
June 2015, Wiley-IEEE Press
List Price: US $212.95
Government Price: US $143.32
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Semiconductor Material and Device Characterization, 3rd Edition (0471739065) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.

  • Written by the main authority in the field of semiconductor characterization
  • New end-of-chapter problems
  • Out of date figures have been replaced
  • Extensive, up-to-date references
  • Revised material throughout, as well as two fully new chapters
  • An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. 

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