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Advances in Speckle Metrology and Related Techniques

ISBN: 978-3-527-40957-0
Hardcover
327 pages
April 2011
List Price: US $175.00
Government Price: US $102.36
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Advances in Speckle Metrology and Related Techniques (3527409572) cover image

1. Radial Speckle Interferometry and Applications
2. Depth-Resolved Displacement Field Measurement
3. Single-Image Interferogram Demodulation
4. Phase Evaluation in Temporal Speckle Pattern Interferometry using Time-Frequency Methods
5. Optical Vortex Metrology
6. Speckle Coding for Optical and Digital Data Security Applications
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