Integrated Circuit Manufacturability: The Art of Process and Design IntegrationISBN: 978-0-7803-3447-2
Hardcover
336 pages
October 1998, Wiley-IEEE Press
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 15-20 days delivery time. The book is not returnable.
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Preface.
Introduction (Jose Pineda de Gyvez).
Defect Monitoring and Characterization (Eric Bruls).
Digital CMOS Fault Modeling and Inductive Fault Analysis (Manoj Sachdev).
Functional Yield Modeling (Gary C. Cheek and Geoff O'Donoghue).
Critical Area and Fault Probability Prediction (D.M.H. Walker).
Statistical Methods of Parametric Yield and Quality Enhancement (Maciej Styblinski).
Architectural Fault Tolerance (S.K. Tewksbury).
Design for Test and Manufacturability (Dhiraj Pradhan and Adit Singh).
Testing Solutions for MCM Manufacturing (Yervant Zorian).
Index.
About the Editors.
Introduction (Jose Pineda de Gyvez).
Defect Monitoring and Characterization (Eric Bruls).
Digital CMOS Fault Modeling and Inductive Fault Analysis (Manoj Sachdev).
Functional Yield Modeling (Gary C. Cheek and Geoff O'Donoghue).
Critical Area and Fault Probability Prediction (D.M.H. Walker).
Statistical Methods of Parametric Yield and Quality Enhancement (Maciej Styblinski).
Architectural Fault Tolerance (S.K. Tewksbury).
Design for Test and Manufacturability (Dhiraj Pradhan and Adit Singh).
Testing Solutions for MCM Manufacturing (Yervant Zorian).
Index.
About the Editors.
Related Titles
General Circuit Theory & Design
Read an Excerpt
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