Failure Mechanisms in Semiconductor Devices, 2nd EditionISBN: 978-0-471-95482-8
Hardcover
360 pages
August 1997
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
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Reliability Mathematics.
Principal Failure Mechanisms.
Failure Mechanisms in Technologies and Circuits.
Reliability Testing.
Reliability Prediction.
Screening.
Failure Analysis.
Quality Assurance.
Appendix.
Indexes.
Principal Failure Mechanisms.
Failure Mechanisms in Technologies and Circuits.
Reliability Testing.
Reliability Prediction.
Screening.
Failure Analysis.
Quality Assurance.
Appendix.
Indexes.
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