Analysis of Microelectronic Materials and DevicesISBN: 978-0-471-95013-4
Paperback
976 pages
May 1995
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Bulk Analysis of Microelectronic Materials.
Analysis of Surfaces, Interfaces and Thin Films.
Structure Analysis on an Atomic Scale.
Physical, Electrical and Geometrical Characterization.
Index.
Analysis of Surfaces, Interfaces and Thin Films.
Structure Analysis on an Atomic Scale.
Physical, Electrical and Geometrical Characterization.
Index.