Wiley.com
Print this page Share

X-Ray Spectrometry: Recent Technological Advances

Kouichi Tsuji (Editor), Jasna Injuk (Editor), René Van Grieken (Editor)
ISBN: 978-0-471-48640-4
Hardcover
616 pages
April 2004
List Price: US $603.25
Government Price: US $347.48
Enter Quantity:   Buy
X-Ray Spectrometry: Recent Technological Advances (047148640X) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.

Contributors.

Preface.

1 Introduction.

1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume.

2 X-Ray Sources.

2.1 Micro X-ray Sources.

2.2 New Synchrotron Radiation Sources.

2.3 Laser-driven X-ray Sources.

3 X-Ray Optics.


3.1 Multilayers for Soft and Hard X-rays.

3.2 Single Capillaries X-ray Optics.

3.3 Polycapillary X-ray Optics.

3.4 Parabolic Compound Refractive X-ray Lenses.

4 X-Ray Detectors.

4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy.

4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry.

4.3 Superconducting Tunnel Junctions.

4.4 Cryogenic Microcalorimeters.

4.5 Position Sensitive Semiconductor Strip Detectors.

5 Special Configurations.

5.1 Grazing-incidence X-ray Spectrometry.

5.2 Grazing-exit X-ray Spectrometry.

5.3 Portable Equipment for X-ray Fluorescence Analysis.

5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis.

5.5 High-energy X-ray Fluorescence.

5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy.

5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy.

5.8 X-Ray Absorption Techniques.

6 New Computerisation Methods.

6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy.

6.2 Spectrum Evaluation.

7 New Applications.

7.1 X-Ray Fluorescence Analysis in Medical Sciences.

7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films.

7.3 X-Ray Spectrometry in Archaeometry.

7.4 X-Ray Spectrometry in Forensic Research.

7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry.

Index.

Related Titles

More By These Authors

Spectroscopy

by Per Jensen (Editor), Philip R. Bunker (Editor)
by Rita Cornelis (Editor-in-Chief), Joseph A. Caruso (Associate Editor), Helen Crews (Associate Editor), Klaus G. Heumann (Associate Editor)
Back to Top