CMOS Electronics: How It Works, How It FailsISBN: 978-0-471-47669-6
Hardcover
368 pages
March 2004, Wiley-IEEE Press
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JAUME SEGURA, PhD, is an Associate Professor of Electrical
Engineering at the Balearic Islands University, Spain, where he has
been a member of the faculty since 1993. He has been a visiting
researcher at Philips Semiconductors and Intel Corporation, working
on design and test issues. He is a member of the IEEE, the Chairman
of the IEEE-CAS Spanish Chapter, and serves on the technical
program committees of such conferences as ITC, DATE, and VTS.
CHARLES F. HAWKINS, PhD, is a Professor of Electrical Engineering at the University of New Mexico at Albuquerque, where he has been a member of the faculty since 1972. He is also a research contract engineer with the Sandia National Laboratories IC Group and has consulted with Intel Corporation, AMD Corporation, and Philips Research Labs on issues of quality, reliability, testability research, and testing. Professor Hawkins is a Member of IEEE and a member of the Electronic Device Failure Analysis Society (EDFAS) of ASM, as well as the editor of EDFAS Magazine. Professor Hawkins frequently teaches short courses and industrial seminars to leading chip manufacturers worldwide.