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Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition

Dawn Bonnell (Editor)
ISBN: 978-0-471-24824-8
Hardcover
516 pages
December 2000
List Price: US $290.25
Government Price: US $200.28
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Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition (047124824X) cover image
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FUNDAMENTALS OF OPERATION.

Introduction (D. Bonnell).

Electron Tunneling, Atomic Forces, and Scanning Probe Microscopy (D. Bonnell & B. Huey).

Theory of Scanning Tunneling Microscopy (J. Tersoff).

Methods of Tunneling Spectroscopy with STM (R. Hamers & D. Padowitz).

TIPS AND SURFACES.

The Surface Structure of Crystalline Solids (W. Unertle).

The Preparation of Tips and Sample Surfaces for Scanning Probe Experiments (G. Rohrer & R. Smith).

APPLICATIONS OF SCANNING PROBE MICROSCOPY.

Electrostatic and Magnetic Force Microscopy (S. Kalinin & D. Bonnell).

BEEM and Characterization of Buried Interfaces (W. Kaiser, et al.).

The Scanning Probe Microscopy in Biology (S. Lindsay).

Nanomechanics with SPM (N. Burnham & R. Colton).

Near Field Scanning Optical Microscopy (D. Higgins & E. Mei).

Applications of Electrochemical Probe Microscopy (A. Bard & F. Fan).

Appendices.

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