Wiley.com
Print this page Share

Statistical Methods for Reliability Data

ISBN: 978-0-471-14328-4
Hardcover
712 pages
July 1998
List Price: US $208.95
Government Price: US $133.72
Enter Quantity:   Buy
Statistical Methods for Reliability Data (0471143286) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.

WILLIAM Q. MEEKER, PhD, is Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is a Fellow of the American Statistical Association and an elected member of the International Statistics Institute. Among his many awards and honors are the Youdan Prize and two Wilcoxon Prizes as well as two awards for outstanding teaching at Iowa State. He is coauthor of Statistical Intervals: A Guide for Practitioners (Wiley) and of numerous book chapters and publications in the engineering and statistical literature. A former editor of Technometrics and coeditor of Selected Tables in Mathematical Statistics, he is currently Associate Editor for International Statistical Review.

LUIS A. ESCOBAR, PhD, is a Professor in the Department of Experimental Statistics at Louisiana State University. His research and consulting interests include statistical analysis of reliability data, accelerated testing, survival analysis, and nonlinear models. An Associate Editor for Technometrics and the IIE Transactions of Quality and Reliability Engineering, Professor Escobar is a Fellow of the American Statistical Association and elected member of the International Statistics Institute. He is the author of several book chapters, and his publications have appeared in the engineering and statistical literature.

Related Titles

More From This Series

by Samuel Kotz, Narayanaswamy Balakrishnan, Norman L. Johnson
by Paul P. Biemer (Editor), Robert M. Groves (Editor), Lars E. Lyberg (Editor), Nancy A. Mathiowetz (Editor), Seymour Sudman (Editor)
by Bovas Abraham, Johannes Ledolter

Quality, Productivity & Reliability

by Wallace R. Blischke, D. N. Prabhakar Murthy
by Gerald J. Hahn, Necip Doganaksoy
by Wallace R. Blischke (Editor), D. N. Prabhakar Murthy (Editor)
Back to Top