Microwave Electronics: Measurement and Materials CharacterizationISBN: 978-0-470-84492-2
Hardcover
552 pages
April 2004
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 15-20 days delivery time. The book is not returnable.
|
||||||
L. F. Chen is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
C. K. Ong is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
C. P. Neo is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
V. V. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
Vijay K. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
More By These Authors
Related Titles
More By These Authors
RF / Microwave Theory & Techniques
Read Online Now at Wiley Online Library
An online version of this product is available through our
subscription-based content service.
Read Online
.png){kind=small}
Join An E-mail ListLearn about the latest products, events, offers and content. |
