Statistical Regression with Measurement Error: Kendall's Library of Statistics 6ISBN: 978-0-470-71106-4
Hardcover
282 pages
June 2010
 This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.
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Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.
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