Wiley.com
Print this page Share

Statistical Analysis and Modelling of Spatial Point Patterns

ISBN: 978-0-470-01491-2
Hardcover
560 pages
February 2008
List Price: US $167.50
Government Price: US $112.60
Enter Quantity:   Buy
Statistical Analysis and Modelling of Spatial Point Patterns (0470014911) cover image
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 10-15 days delivery time. The book is not returnable.

Janine Illian, SIMBIOS, University of Abertay, Dundee, Scotland.

Antti Pentinen, Professor in the Department of Mathematics and Statistics, University of Jyvaskyla, Finland.

Dietrich Stoyan, Professor a the Insitut für Stochastik, University of Freiberg, Germany.

More By These Authors

Back to Top